Hope everything goes well!
From reliability(IC) point of view, (FI)CDM test method been used for decades to qualify IC robustness. And this test method is a way to separate ±charge in IC, which “NET” charge is zero.
And from the other point of view, CDM model is generated by + or - charge in IC, which “NET” charge is not zero.
For some case, which was diagnosed by CDM damage, and we try to replicate by (FI)CDM tester, somehow it can’t.
So I am wondering that what’s going on:
- Anyone have experience on this?
- In reality, a charged IC and its discharge(CDM) is more complicated than (FI)CDM?
- (FI)CDM test can cover CDM?
Kindly advice, thank you.